20X Nikon CFI60 LU Plan Epi ELWD Infinity Corrected Objective BOOM STANDS STANDS Surface defect detection and coating

Surface defect detection and coating analysis

and any application requiring detailed optical characterization of anisotropic materials

and silicon wafer inspection at wavelengths where standard objectives are opaque or poorly transmitting

This magnification range is particularly valuable for metallographic analysis

✓ New condition with full brightness and rated lamp life

20X Nikon CFI60 LU Plan Epi ELWD Infinity Corrected Objective BOOM STANDS STANDS Surface defect detection and coatingNIKON LU PLAN 20X ELWD EPI OBJECTIVE LENS M25 THREAD INFINITY CORRECTED COMPATIBLE WITH: NIKON REFLECTED LIGHT MICROSCOPES WORKING DISTANCE: 13 MM NUMERICAL APERTURE: 0. 40 CATALOG NUMBER: MUE41200 CONDITION: EXCELLENT, AS NEW UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS