Diagnostic Instruments D10 NEF F-Mount Camera Adapter PLAN APO Silicon wafer backside and through-silicon
Description
Silicon wafer backside and through-silicon inspection at 50× requiring maximum working clearance
NIKON 40X DIC OBJECTIVE RMS THREAD
LEICA MZ12
Add complete phase contrast capability to your BH2 microscope with this turret condenser
delivering good resolution and contrast for cell biology
Diagnostic Instruments D10 NEF F-Mount Camera Adapter PLAN APO Silicon wafer backside and through-siliconDIAGNOSTIC INSTRUMENTS D10NEF 1. 0 X F MOUNT WITH FOCUS ADJUSTMENT FOR NIKON ECLIPSE MICROSCOPES F MOUNT CATALOG NUMBER: D10 NEF CONDITION: EXCELLENT UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS
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