Olympus ULWD MIRPLAN 5X IR Objective U-ANT π§ Universal Leica Compatibility β
Description
π§ Universal Leica Compatibility β Compatible with all Leica stereo microscope systems for versatile integration
Entomology
The Olympus PLAN N 40X PH2 phase contrast objective is specifically engineered for high-resolution phase contrast microscopy with plan achromat optical design
Semiconductor wafer defect detection and analysis
rough or highly textured surfaces with significant topographical variation
Olympus ULWD MIRPLAN 5X IR Objective U-ANT π§ Universal Leica Compatibility βUltra long working distance 5 IR objective with high NA ideal for near infrared imaging with exceptional clearance. 5 Magnification, NA 0. 40 High numerical aperture for excellent resolution in IR imaging. Infrared (IR) Optimized Corrected for near infrared wavelengths, ideal for silicon wafer inspection and IR applications. Ultra Long Working Distance (20 mm) Exceptional clearance for thick specimens, probe stations, and in situ testing. MIRPLAN
Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
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