Nikon L Plan 20X SLWD EPI Objective NIKON STAGES NIKON Rapid specimen orientation and coarse

Rapid specimen orientation and coarse defect location in multi-magnification inspection workflows

Infrared imaging applications

making it a versatile upgrade for existing microscope configurations requiring imaging capability or an ideal component for new system builds

hunched shoulders

The "Super Fluor" designation indicates enhanced optical performance compared to standard fluorite objectives

Nikon L Plan 20X SLWD EPI Objective NIKON STAGES NIKON Rapid specimen orientation and coarseNIKON L PLAN 20X SLWD EPI OBJECTIVE M32 THREAD WORKING DISTANCE: 24 MM CATALOG NUMBER MUE30200 CONDITION: LIGHT USE FLAWLESS OPTICS UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS