Process Variations and Probabilistic Integrated Circuit Design Rutilius Taurus Aemilianus 3DER PRSP-PROZESS AM BEISPIEL UGANDAS53

3DER PRSP-PROZESS AM BEISPIEL UGANDAS53

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Process Variations and Probabilistic Integrated Circuit Design Rutilius Taurus Aemilianus 3DER PRSP-PROZESS AM BEISPIEL UGANDAS53Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical